Shockley-Frank stacking faults in 6H-SiC-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Shockley-Frank stacking faults in 6H-SiC

Published:2012-06 Issue:11 Volume:111 Page:113527
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Sun J. W.,Robert T.,Andreadou A.,Mantzari A.,Jokubavicius V.,Yakimova R.,Camassel J.,Juillaguet S.,Polychroniadis E. K.,Syväjärvi M.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4729064

Reference18 articles.

1. Silicon Carbide

2. Dislocation Content of Micropipes in SiC

3. Growth and Defect Reduction of Bulk SiC Crystals

4. Progress in the industrial production of SiC substrates for semiconductor devices

5. Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Controlling the electrical resistivity of porous silicon carbide ceramics and their applications: A review;International Journal of Applied Ceramic Technology;2022-02-24

2. Characterization of Dislocations in 6H-SiC Wafer Through X-Ray Topography and Ray-Tracing Simulations;Journal of Electronic Materials;2021-04-26

3. Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy;Scientific Reports;2017-07-07

4. Pairwise correlations in layered close-packed structures;Acta Crystallographica Section A Foundations and Advances;2015-06-02

5. Advances in wide bandgap SiC for optoelectronics;The European Physical Journal B;2014-03-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3