Photoemission and conduction currents in vacuum ultraviolet irradiated aluminum oxide
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1428790
Reference11 articles.
1. The effects of processing on radiation damage in SiO2
2. Radiation Damage in SiO2/Si Induced by VUV Photons
3. Plasma vacuum ultraviolet emission in an electron cyclotron resonance etcher
4. Radiation Damage to Thermal Silicon Dioxide Films in Radio Frequency and Microwave Downstream Photoresist Stripping Systems
5. In Situ Monitoring of Radiation Damage to Thermal Silicon Dioxide Films Exposed to Downstream Oxygen Plasmas
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