Method for examining solid specimens with improved resolution in the scanning electron microscope (SEM)
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1654916
Reference4 articles.
1. High‐resolution thermionic cathode scanning transmission electron microscope
2. NEW CONTRAST MECHANISM FOR SCANNING ELECTRON MICROSCOPE
3. Low‐Loss Image for Surface Scanning Electron Microscope
4. A scanning microscope with 5 Å resolution
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