Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers-Reference-Cited by-同舟云学术

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Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers

Published:2016-12 Issue: Volume:171 Page:126-138
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Wan Q.,Masters R.C.,Lidzey D.,Abrams K.J.,Dapor M.,Plenderleith R.A.,Rimmer S.,Claeyssens F.,Rodenburg C.

Funder

EPSRC, UK)

Leverhulme Trust

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference41 articles.

1. Low-voltage, high-resolution scanning electron microscopy: a new characterization technique for polymer morphology

2. LVSEM for High Resolution Topographic and Density Contrast Imaging

3. Secondary electron emission in the scanning electron microscope

4. Low voltage imaging and X-ray microanalysis in the SEM: challenges and opportunities

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