Observation of strong contrast from doping variations in transmission electron microscopy of InP‐based semiconductor laser diodes-Reference-Cited by-同舟云学术

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Observation of strong contrast from doping variations in transmission electron microscopy of InP‐based semiconductor laser diodes

Published:1995-01-16 Issue:3 Volume:66 Page:341-343
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Hull R.,Stevie F. A.,Bahnck D.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.114206

Reference6 articles.

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