Dislocation dynamics in strain relaxation in GaAsSb∕GaAs heteroepitaxy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2245206
Reference29 articles.
1. Comparison of In[sub 0.33]Al[sub 0.67]As/In[sub 0.34]Ga[sub 0.66]As on GaAs metamorphic high electron mobility transistors grown by molecular beam epitaxy with normal and inverse step on linear graded buffer layers
2. Real Time Measurement of Epilayer Strain Using a Simplified Wafer Curvature Technique
3. Stress and Relief of Misfit Strain of Ge/Si(001)
4. Stress evolution during Fe(001) epitaxy on GaAs(001)
5. Strain relaxation and segregation effects during self-assembled InAs quantum dots formation on GaAs(001)
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1. Strain relaxation in low-mismatched GaAs/GaAs1-xSbx/GaAs heterostructures;Acta Materialia;2019-01
2. Effect of strain on band alignment of GaAsSb/GaAs quantum wells;Journal of Applied Physics;2017-07-28
3. Critical thickness of GaN on AlN: impact of growth temperature and dislocation density;Semiconductor Science and Technology;2017-06-28
4. Growth, strain relaxation properties and high-κ dielectric integration of mixed-anion GaAs1-ySby metamorphic materials;Journal of Applied Physics;2014-10-07
5. Formation energies and equilibrium configurations of dislocation arrays with alternating Burgers vectors in layered heterostructures;Journal of Crystal Growth;2010-06
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