Calibrating a tuning fork for use as a scanning probe microscope force sensor
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2743166
Reference13 articles.
1. Piezoelectric tip‐sample distance control for near field optical microscopes
2. Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor
3. Dynamic behavior of tuning fork shear-force feedback
4. High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
5. Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
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