Diffuse x‐ray scattering from misfit dislocations in SiGe epitaxial layers with graded Ge content
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.359728
Reference23 articles.
1. The estimation of dislocation densities in metals from X-ray data
2. The measurement of threading dislocation densities in semiconductor crystals by X-ray diffraction
3. Separate measurements of dynamical and kinematical X-ray diffractions from silicon crystals with a triple crystal diffractometer
4. Characterization of process-induced defects in silicon with triple-crystal diffractometry
5. X-ray diffraction from low-dimensional structures
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