Author:
Geng Peter,Márquez Juan,Geelhaar Lutz,Platen Jutta,Setzer Carsten,Jacobi Karl
Cited by
47 articles.
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4. Streamlined inexpensive integration of a growth facility and scanning tunneling microscope for in-situ characterization;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2011-07
5. Molecular Beam Epitaxy: An Overview;Comprehensive Semiconductor Science and Technology;2011