Streamlined inexpensive integration of a growth facility and scanning tunneling microscope for in-situ characterization
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Published:2011-07
Issue:4
Volume:29
Page:041804
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ISSN:2166-2746
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Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
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language:en
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Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Author:
Xu P.,Qi D.,Barber S. D.,Cook C. T.,Ackerman M. L.,Thibado P. M.
Publisher
American Vacuum Society
Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials