Direct evidence for diffusion and electromigration of Cu in CuInSe2-Reference-Cited by-同舟云学术

Direct evidence for diffusion and electromigration of Cu in CuInSe2

Published:1997-11 Issue:9 Volume:82 Page:4282-4285
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Gartsman Konstantin,Chernyak Leonid,Lyahovitskaya Vera,Cahen David,Didik Vladimir,Kozlovsky Vitaliy,Malkovich Roald,Skoryatina Elena,Usacheva Valentina

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.366252

Reference23 articles.

1. CuInSe2 for photovoltaic applications

2. CuInSe2 for photovoltaic applications

3. Motion ofp‐njunctions in CuInSe2

4. Room-Temperature, Electric Field-Induced Creation of Stable Devices in CulnSe 2 Crystals

5. Ion migration in chalcopyrite semiconductors

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