Attractive‐mode atomic force microscopy with optical detection in an orthogonal cantilever/sample configuration-Reference-Cited by-同舟云学术

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Attractive‐mode atomic force microscopy with optical detection in an orthogonal cantilever/sample configuration

Published:1992-03-15 Issue:6 Volume:71 Page:2499-2502
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Yang P. C.,Chen Y.,Vaez‐Iravani M.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.351064

Reference23 articles.

1. Atomic Force Microscope

2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

3. Novel optical approach to atomic force microscopy

4. Compact scanning-force microscope using a laser diode

5. Force microscope using a fiber‐optic displacement sensor

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