Analysis of the photo voltage decay (PVD) method for measuring minority carrier lifetimes inP‐Njunction solar cells
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.329478
Reference9 articles.
1. On the Transient Behavior of Semiconductor Rectifiers
2. Measurement of minority carrier lifetime in solar cells from photo-induced open-circuit voltage decay
3. Mathematical formulation for the photo-induced open circuit voltage decay method for measurement of minority carrier lifetime in solar cells
4. Mathematical formulation for the photo-induced open circuit voltage decay method for measurement of minority carrier lifetime in solar cells
5. A simple theory of back-surface-field (BSF) solar cells
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