Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains-Reference-Cited by-同舟云学术

Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains

Published:2009-12 Issue:12 Volume:80 Page:123703
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Mikkelsen A.,Schwenke J.,Fordell T.,Luo G.,Klünder K.,Hilner E.,Anttu N.,Zakharov A. A.,Lundgren E.,Mauritsson J.,Andersen J. N.,Xu H. Q.,L’Huillier A.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3263759

Reference38 articles.

1. Photoelectron microscopy

2. Photoemission electron microscopy with chemical sensitivity: SPELEEM methods and applications

3. PEEM with high time resolution—imaging of transient processes and novel concepts of chromatic and spherical aberration correction

4. Time-resolved photoemission electron microscopy of magnetic field and magnetisation changes

5. Quantitative Analysis of Magnetic Excitations in Landau Flux-Closure Structures Using Synchrotron-Radiation Microscopy

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