Effect of stresses on the dielectric and piezoelectric properties of Pb(Zr0.52Ti0.48)O3 thin films

Author:

Coleman K.1,Walker J.12,Beechem T.3,Trolier-McKinstry S.1ORCID

Affiliation:

1. Materials Science and Engineering Department and Materials Research Institute, Pennsylvania State University, Millennium Science Complex, University Park, Pennsylvania 16802, USA

2. Department of Materials Science and Engineering, Norwegian University of Science and Technology, N-7491 Trondheim, Norway

3. Sandia National Laboratories, Albuquerque, New Mexico 87185, USA

Funder

National Science Foundation

Publisher

AIP Publishing

Subject

General Physics and Astronomy

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