Diffraction contrast and Bragg reflection determination in forescattered electron channeling contrast images of threading screw dislocations in 4H-SiC-Reference-Cited by-同舟云学术

Diffraction contrast and Bragg reflection determination in forescattered electron channeling contrast images of threading screw dislocations in 4H-SiC

Published:2008-12-15 Issue:12 Volume:104 Page:124906
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Picard Yoosuf N.,Twigg Mark E.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3042224

Reference25 articles.

1. The effects of surface stress relaxation on electron channelling contrast images of dislocations

2. Some comments on the interpretation of the ‘kikuchi-like reflection patterns’ observed by scanning electron microscopy

3. A dynamical theory for the contrast of perfect and imperfect crystals in the scanning electron microscope using backscattered electrons

4. Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast

5. Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films

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