In-situ synchrotron micro-diffraction study of surface, interface, grain structure, and strain/stress evolution during Sn whisker/hillock formation-Reference-Cited by-同舟云学术

In-situ synchrotron micro-diffraction study of surface, interface, grain structure, and strain/stress evolution during Sn whisker/hillock formation

Author:

Pei Fei¹,Jadhav Nitin²,Buchovecky Eric³,Bower Allan F.¹,Chason Eric¹,Liu Wenjun⁴,Tischler Jonathan Z.⁴,Ice Gene E.⁵,Xu Ruqing⁴^ORCID

Affiliation:

1. School of Engineering, Brown University, Providence, Rhode Island 02912, USA

2. IBM, Hopewell Junction, New York 12533, USA

3. Saint-Gobain, Northboro R&D Center, Northborough, Massachusetts 01532, USA

4. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

5. Oak Ridge National Lab, Oak Ridge, Tennessee 37831, USA

Funder

National Science Foundation (NSF)

U.S. Department of Energy (DOE)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

Reference42 articles.

2. See http://nepp.nasa.gov/whisker/ for NASA. Multiple examples of whisker-induced failures are documented on the NASA website.

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