Deep trapping controlled switching characteristics in amorphous silicon thin‐film transistors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.343947
Reference12 articles.
1. Charge trapping effects in amorphous silicon/silicon nitride thin film transistors
2. Dynamic Characteristics of Amorphous Silicon Thin Film Transistors
3. A physical interpretation of dispersive transport in disordered semiconductors
4. Photocurrent Transient Spectroscopy: Measurement of the Density of Localized States ina-As2Se3
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