Parameter sensitivity analysis of nonlinear piezoelectric probe in tapping mode atomic force microscopy for measurement improvement
Author:
Funder
NSF
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4865793
Reference24 articles.
1. Modeling Piezoresponse Force Microscopy for Low-Dimensional Material Characterization: Theory and Experiment
2. Coupled Flexural-Torsional Nonlinear Vibrations of Piezoelectrically Actuated Microcantilevers With Application to Friction Force Microscopy
3. Sensitivity analysis of nanoparticles pushing manipulation by AFM in a robust controlled process
4. Characterization of sputtered ZnO thin film as sensor and actuator for diamond AFM probe
5. Development of a force sensor for atomic force microscopy using piezoelectric thin films
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1. Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy;Materials;2023-09-24
2. Atominių jėgų mikroskopo jutiklio mechaninės struktūros modeliavimas ir dinaminių charakteristikų tyrimas;2019
3. Dynamic mulitmode analysis of non-linear piezoelectric microcantilever probe in bistable region of tapping mode atomic force microscopy;International Journal of Non-Linear Mechanics;2015-09
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