Development of a force sensor for atomic force microscopy using piezoelectric thin films
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Reference21 articles.
1. Atomic Force Microscope
2. Atomic Resolution with Atomic Force Microscope
3. Atomic resolution imaging of a nonconductor by atomic force microscopy
4. An atomic‐resolution atomic‐force microscope implemented using an optical lever
5. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
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