Thermal imaging by atomic force microscopy using thermocouple cantilever probes
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145474
Reference19 articles.
1. Surface Studies by Scanning Tunneling Microscopy
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4. Temperature distribution in Si-MOSFETs studied by micro-Raman spectroscopy
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