Hybrid multiple diffraction in Renninger scan for heteroepitaxial layers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.349367
Reference8 articles.
1. Modulation of Renninger scan intensity: A new x‐ray technique to characterize epitaxial structures
2. X-ray multiple diffraction as a tool for studying heteroepitaxial layers
3. Simulation of hybrid reflections in X-ray multiple diffraction experiments
4. The geometry of X-ray multiple diffraction in crystals
Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Assessment of phase transition and thermal expansion coefficients by means of secondary multiple reflections of Renninger scans;Journal of Applied Crystallography;2019-10-17
2. Hybrid reflections from multiple x-ray scattering in epitaxial oxide films;Applied Physics Letters;2017-09-25
3. Hybrid multiple diffraction in semipolar wurtzite materials: (\bf 01\overline{1}2)-oriented ZnMgO/ZnO heterostructures as an illustration;Journal of Applied Crystallography;2017-07-26
4. Experimental evidence of transition between dynamical and kinematical diffraction regimes in ion-implanted Si observed through X-ray multiple-beam diffraction mappings;Applied Physics Letters;2016-10-03
5. X-ray multiple diffraction of ZnO substrates and heteroepitaxial thin films;physica status solidi (b);2014-01-27
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