Analysis of Semiconductor p‐n Junctions and Junction Devices by a Flux Method
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1777203
Reference4 articles.
1. Alternative Approach to the Solution of Added Carrier Transport Problems in Semiconductors
2. Physical Properties of Calcium Tungstate X‐Ray Screens
3. General Semiconductor Junction Relations†
4. Volume and Surface Recombination Rates for Injected Carriers in Germanium
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. An appraisal of the one-flux method for treating carrier transport in modern semiconductor devices;Solid-State Electronics;1996-06
2. Flux method for the analysis of excess carrier transport in multilayer devices in the presence of electric field;Solid-State Electronics;1990-12
3. Generalized equations for the steady-state analysis of inhomogeneous semiconductor devices;Solid-State Electronics;1990-08
4. A flux analysis of the current–voltage characteristics of thin film frontwall illuminated and backwall illuminated liquid junction and metal junction solar cells;Journal of Applied Physics;1983-04
5. Field‐dependent transport through the depletion layer of a semiconducting electrode;Journal of Applied Physics;1981-12
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