Nanooxidation of silicon with an atomic force microscope: A pulsed voltage technique
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.123257
Reference21 articles.
1. Modification of hydrogen‐passivated silicon by a scanning tunneling microscope operating in air
2. Infrared spectroscopy of Si(111) surfaces after HF treatment: Hydrogen termination and surface morphology
3. Reaction of water with hydrofluoric acid treated silicon(111) and (100) surfaces
4. Infrared spectroscopy of Si(111) and Si(100) surfaces after HF treatment: Hydrogen termination and surface morphology
5. Silicon surface passivation by hydrogen termination: A comparative study of preparation methods
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