Author:
Tung Chih Hang,Pey Kin Leong,Ranjan Rakesh,Tang Lei Jun,Ang Diing Shenp
Subject
Physics and Astronomy (miscellaneous)
Reference13 articles.
1. Polarity effect on failure of Ni and Ni2Si contacts on Si
2. Polarity Effect of Electromigration in Ni2Si Contacts on Si
3. International Reliability Physics Symposium (IRPS) IEEE;Pey K. L.,2002
4. Proceedings of the Tenth International Symposium on the Physical and Failure Analysis of Integrated Circuits (IEEE IPFA);Tang L. J.,2003
5. 11th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA 2004);Sun Y.,2004
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献