Analytic model for the efficiency droop in semiconductors with asymmetric carrier-transport properties based on drift-induced reduction of injection efficiency
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4704366
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1. Faster recovery time of a hot-electron transition-edge sensor by use of normal metal heat-sinks
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3. Heavy doping effects in Mg-doped GaN
4. Efficiency droop in AlGaInP and GaInN light-emitting diodes
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