Interface roughness and interface roughness scattering in amorphous oxide thin-film transistors-Reference-Cited by-同舟云学术

Interface roughness and interface roughness scattering in amorphous oxide thin-film transistors

Published:2021-10-14 Issue:14 Volume:130 Page:145302
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Wang Xiao¹²^ORCID,Dodabalapur Ananth¹²^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, USA

2. Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, USA

Funder

National Science Foundation

Semiconductor Research Corporation

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://aip.scitation.org/doi/am-pdf/10.1063/5.0065088

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