Nondestructive electroluminescence characterization of as-grown semiconductor optoelectronic device structures using indium–tin–oxide coated electrodes
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1150550
Reference2 articles.
1. Photoluminescence spectroscopy of crystalline semiconductors
2. Absorption, emission, and gain spectra of 1.3 µm InGaAsP quaternary lasers
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