Curvature analysis of single layer graphene on the basis of extreme low-frequency Raman spectroscopy
Author:
Affiliation:
1. School of Physics, Zhejiang University of Science and Technology, Hangzhou 310023, China
2. School of Physics, University College Dublin, Belfield, Dublin 4, Ireland
Funder
Enterprise Ireland
Science Foundation Ireland
National Natural Science Foundation of China
Natural Science Foundation of Zhejiang Province
Zhejiang Province Public Welfare Technology Application Research Project
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5090908
Reference49 articles.
1. Electric Field Effect in Atomically Thin Carbon Films
2. Science and technology roadmap for graphene, related two-dimensional crystals, and hybrid systems
3. The rise of graphene
4. Graphene photonics and optoelectronics
5. Raman scattering studies of graphene under high pressure
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Ultralow‐Frequency Tip‐Enhanced Raman Scattering Discovers Nanoscale Radial Breathing Mode on Strained 2D Semiconductors;Advanced Materials;2024-07-15
2. Two-Legged Molecular Walker and Curvature: Mechanochemical Ring Migration on Graphene;Journal of the American Chemical Society;2023-12-04
3. Mechanochemical Molecular Motion Using Noncovalent Interactions on Graphene and Its Application to Tailoring the Adsorption Energetics;ACS Materials Letters;2023-01-18
4. Mechanochemical Molecular Migration on Graphene;Journal of the American Chemical Society;2022-04-13
5. High pressure studies of 2D materials and heterostructures: A review;Materials & Design;2022-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3