Transmission electron microscopic observation of nanoindentations made on ductile-machined silicon wafers
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2133908
Reference26 articles.
1. Phase transition in diamond-structure crystals during hardness measurements
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5. The extent of phase transformation in silicon hardness indentations
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