Electron microscope investigation of the microplastic deformation mechanisms of silicon by indentation-Reference-Cited by-同舟云学术

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Electron microscope investigation of the microplastic deformation mechanisms of silicon by indentation

Published:1972-11-16 Issue:1 Volume:14 Page:317-330
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:en
Short-container-title:Phys. Stat. Sol. (a)

Author:

Eremenko V. G.,Nikitenko V. I.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. Sbornik Dislokatsii i Fiz. Svoistva Poluprovodnikov, Nauka, Leningrad 1967.

2. Deformation twinning in materials of the A 4 (diamond) crystal structure

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