1/f noise measurements for characterizing multispot low‐Ohmic contacts
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.322935
Reference9 articles.
1. Transport Properties of the Gold Germanium Gallium Arsenide Metal Semiconductor System
2. Metal semiconductor contact: Resistivity and noise
3. Screening of metal film defects by current noise measurements
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3. Preface;Specular Gloss;2008
4. References;Specular Gloss;2008
5. Resistive switching and noise in non-volatile organic memories;SPIE Proceedings;2007-06-07
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