CHARACTERIZATION OF CONTACT INTERFACE, FILM SHEET RESISTANCE AND 1/f NOISE WITH CIRCULAR CONTACTS
Author:
Affiliation:
1. Eindhoven University of Technology, Electrical Engineering, PT 9.13, 5600MB Eindhoven, Netherlands
Abstract
Publisher
World Scientific Pub Co Pte Lt
Subject
General Physics and Astronomy,General Mathematics
Link
https://www.worldscientific.com/doi/pdf/10.1142/S0219477511000740
Reference63 articles.
1. Noise as a diagnostic tool for quality and reliability of electronic devices
2. 1/f NOISE AS A DIAGNOSTIC TOOL TO INVESTIGATE THE QUALITY OF ANISOTROPIC CONDUCTIVE ADHESIVE (ACA) BONDS FOR BALL GRID ARRAYS (BGA'S)
3. An improved transmission line structure for contact resistivity measurements
4. Determination of contact resistivity by a modified Cox and Strack method in case of finite metal sheet resistance
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