Improved steady-state photocarrier grating in nanocrystalline thin films after surface-roughness reduction by mechanical polishing
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.121913
Reference11 articles.
1. Device-quality polycrystalline and amorphous silicon films by hot-wire chemical vapour deposition
2. Steady‐state photocarrier grating technique for diffusion length measurement in photoconductive insulators
3. Steady‐state photocarrier grating technique for diffusion‐length measurement in semiconductors: Theory and experimental results for amorphous silicon and semi‐insulating GaAs
4. Band Tailing and Transport in a-SiGe:H-Alloys
5. Characterization of high electronic quality a-SiC:H films by μτ products for electrons and holes
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1. The effects of air, oxygen and water exposure on the sub-bandgap absorption, the electronic conductivity and the ambipolar diffusion length in highly crystalline microcrystalline silicon films for photovoltaic applications;Journal of Materials Science: Materials in Electronics;2020-02-01
2. Steady-State Photocarrier Grating Method;Advanced Characterization Techniques for Thin Film Solar Cells;2016-07-22
3. Investigation of meta- and in-stability effects in hydrogenated microcrystalline silicon thin films by the steady-state measurement methods;Canadian Journal of Physics;2014-07
4. The Effect of Power Density on Diffusion Length and Energy Gap of a-Si:H and nc-Si:H Thin Films Prepared by PECVD Technique;Acta Physica Polonica A;2012-09
5. Steady-State Photocarrier Grating Method;Advanced Characterization Techniques for Thin Film Solar Cells;2011-04-07
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