Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4776705
Reference23 articles.
1. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
2. Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
3. Transport limitations and Schottky barrier height in titanium silicide nanowires grown on the Si(111) surface
4. Tip preparation for usage in an ultra-low temperature UHV scanning tunneling microscope
5. Preparation and characterization of electrochemically etched W tips for STM
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