X-Ray-Based Techniques for 2D Materials

Abstract

X-ray-based analytical techniques are the essential tool behind some of the most important scientific discoveries of the twenty-first century. The X-ray-based analysis instruments such as X-ray diffraction (XRD), X-ray fluorescence (XRF), X-ray absorption fine-structure (XAFS), and X-ray photoelectron spectroscopy (XPS) deliver rapid qualitative as well as quantitative determination of a wide variety of two-dimensional (2D) materials. By use of X-rays, these techniques provide substantial structural and compositional information on several kinds of materials including nanostructures, metals, polymers, and ceramics. These analysis techniques deliver information on structures, phases, crystallinity, elemental composition, and chemical states of 2D materials. This chapter summarizes the principle, instrumentation, and applications of these techniques for the analysis of 2D materials.