Sub-5 μm-thick spalled single crystal Si foils by decoupling crack initiation and propagation-Reference-Cited by-同舟云学术

Sub-5 μm-thick spalled single crystal Si foils by decoupling crack initiation and propagation

Published:2016-09-26 Issue:13 Volume:109 Page:132101
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Lee Yong Hwan¹,Kim Yong-Jae²,Han Seung Min Jane¹,Song Hee-eun³,Oh Jihun¹

Affiliation:

1. Graduate School of Energy, Environment, Water, and Sustainability (EEWS), Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea

2. Frontier in Extreme Physics, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, Republic of Korea

3. Photovoltaic Laboratory, Korea Institute of Energy Research (KIER), 152 Gajeong-ro, Yuseong-gu, Daejeon 34129, Republic of Korea

Funder

Korea Institute of Energy Research (KIER)

National Research Foundation of Korea (NRF)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4963292

Reference19 articles.

1. Extremely Flexible Nanoscale Ultrathin Body Silicon Integrated Circuits on Plastic