Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy
Author:
Affiliation:
1. EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
2. FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands
Funder
Univeristy of Antwerp
European Research Council (ERC)
Seventh Framework Programme (FP7)
Fonds Wetenschappelijk Onderzoek (FWO)
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4943086
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