Atomic-level imaging of beam-sensitive COFs and MOFs by low-dose electron microscopy-Reference-Cited by-同舟云学术

Atomic-level imaging of beam-sensitive COFs and MOFs by low-dose electron microscopy

Published:2024 Issue:6 Volume:9 Page:900-933
ISSN:2055-6756
Container-title:Nanoscale Horizons
language:en
Short-container-title:Nanoscale Horiz.

Author:

Zhan Zhen¹,Liu Yuxin¹,Wang Weizhen¹,Du Guangyu¹,Cai Songhua¹^ORCID,Wang Peng²^ORCID

Affiliation:

1. Department of Applied Physics, The Hong Kong Polytechnic University, Kowloon 999077, Hong Kong SAR, China

2. Department of Physics, University of Warwick, CV4 7AL, Coventry, UK

Abstract

This review focuses on the mechanisms of beam damage in COFs and MOFs and evaluates various strategies to mitigate this damage using advanced low-dose TEM/STEM techniques in observing atomic defects, host–guest interactions, and surface structures.

Funder

Hong Kong Polytechnic University

Research Grants Council, University Grants Committee

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/NH/D3NH00494E

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