Quantitative analysis of complex targets by proton‐induced x rays
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.321971
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1. Electron probe microanalysis
2. Selective X-ray generation by heavy ions (Part 1) the use of energetic heavy ions to generate characteristic X-rays from elements in a selective manner
3. X-Ray Generation by Proton Bombardment
4. X-Ray Production Efficiencies for K-, L-, M-, and N-Shell Excitation by Ion Impact
5. Proton-induced X-ray cross sections for selected elements Fe to As and applications of X-ray analysis to semiconductor systems
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