Author:
Gray Tom J.,Lear R.,Dexter R.J.,Schwettmann F.N.,Weimer K.C.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Cited by
31 articles.
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1. MEASUREMENT OF ION IMPLANTATION;Ion Implantation Science and Technology;1988
2. Analysis technology for VLSI fabrication;Proceedings of the IEEE;1987
3. K-shell ionization cross sections and theoretical models;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1986-10
4. M-shell x-ray production cross sections in thick targets of Ir, Pt, and Pb by 0.4–2.2-MeVHe+4ions;Physical Review A;1985-01-01
5. Chapter 5 Analysis by heavy ion induced X-ray emission;Progress in Crystal Growth and Characterization;1984-01