Impact of interface structure on Schottky-barrier height for Ni∕ZrO2(001) interfaces
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1891285
Reference29 articles.
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4. Impact of gate workfunction on device performance at the 50 nm technology node
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