X‐Ray Method for the Determination of the Polarity of SiC Crystals
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1703040
Reference10 articles.
1. Unterschiede in der Intensit�t der R�ntgenstrahlen-reflexion an den beiden 111-Fl�chen der Zinkblende
2. X‐Ray Method for the Differentiation of {111} Surfaces in AIIIBV Semiconducting Compounds
3. Polarity of Gallium Arsenide Single Crystals
4. Intensitätsunterschiede der Röntgen-Reflexe an gegenüberliegenden {111}-Oberflächen von InP
5. Effect of Crystal Perfection and Polarity on Absorption Edges Seen in Bragg Diffraction
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