Theory of beam‐induced currents in semiconductors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.94016
Reference10 articles.
1. Application of scanning electron microscopy to determination of surface recombination velocity: GaAs
2. Theory of life time measurements with the scanning electron microscope: Steady state
3. Effect of grain boundaries in silicon on minority‐carrier diffusion length and solar‐cell efficiency
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