Author:
Padilla M.,Michl B.,Thaidigsmann B.,Warta W.,Schubert M.C.
Funder
German Federal Ministry for the Environment, Nature Conservation and Nuclear Safety
Subject
Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Reference29 articles.
1. Evaluation of diffusion lengths and surface recombination velocities from electron beam induced current scans;Donolato;Applied Physics Letters,1983
2. Theory of beam-induced currents in semiconductors;Zook;Applied Physics Letters,1983
3. Quantification of the effects of generation volume, surface recombination velocity, and diffusion length on the electron-beam-induced current and its derivative: determination of diffusion lengths in the low micron and submicron ranges;Luke;Journal of Applied Physics,1985
4. An improved method of light-beam induced current characterization of grain boundaries;Sawyer;Journal of Applied Physics,1986
5. M. Stemmer, S. Martinuzzi, Mapping of local minority carrier diffusion length applied to multicrystalline silicon cells, in: Proceedings of the 11th European Photovoltaic Solar Energy Conference, Montreux, Switzerland, 1992.
Cited by
60 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献