Anomalous capacitance-voltage characteristics of Al/Al-rich Al2O3/p-Si capacitors and their reconstruction
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3156028
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2. Influence of the Excess Al Content on Memory Behaviors of WORM Devices Based on Sputtered Al-Rich Aluminum Oxide Thin Films;Nanoscience and Nanotechnology Letters;2014-09-01
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4. Annealing-Induced Changes in Electrical Characteristics of Al/Al-Rich $\hbox{Al}_{2}\hbox{O}_{3}/p\hbox{-Si}$ Diodes;IEEE Transactions on Electron Devices;2011-01
5. Static dielectric constant of Al nanocrystal/Al2O3 nanocomposite thin films determined by the capacitance-voltage reconstruction technique;Applied Physics Letters;2010-04-26
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