Controlled electromigration protocol revised-Reference-Cited by-同舟云学术

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Controlled electromigration protocol revised

Published:2018-04 Issue:4 Volume:89 Page:043904
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Zharinov Vyacheslav S.¹^ORCID,Baumans Xavier D. A.²,Silhanek Alejandro V.²,Janssens Ewald¹,Van de Vondel Joris¹^ORCID

Affiliation:

1. Laboratory of Solid State Physics and Magnetism, Department of Physics and Astronomy, KU Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium

2. Experimental Physics of Nanostructured Materials, Q-MAT, CESAM, Université de Liège, B-4000 Sart Tilman, Belgium

Funder

KU Leuven

Fonds pour la Formation à la Recherche dans l'Industrie et dans l'Agriculture

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5011953

Reference30 articles.

1. Electromigration in metals

2. Electromigration in Thin Film Conductors

3. Electromigration: A review

4. Electromigration in thin-film interconnection lines: models, methods and results

5. Electromigration and the structure of metallic nanocontacts

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1. Disordered Ballistic Bismuth Nano‐waveguides for Highly Efficient Thermoelectric Energy Conversion;Small;2024-05-28

2. Targeted modifications of monolithic multiterminal superconducting weak-links;Nanoscale;2022

3. Electromigration-enhanced atomic diffusion to improve coating interface bonding;Scripta Materialia;2021-09

4. Influence of long-term exposure of high-density direct current on the current carrying ability of 2G HTSC tapes based on the REBCO;Journal of Physics: Conference Series;2021-07-01

5. Nb -Based Nanoscale Superconducting Quantum Interference Devices Tuned by Electroannealing;Physical Review Applied;2021-03-05

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