Genesis and evolution of extended defects: The role of evolving interface instabilities in cubic SiC-Reference-Cited by-同舟云学术

Genesis and evolution of extended defects: The role of evolving interface instabilities in cubic SiC

Published:2020-06 Issue:2 Volume:7 Page:021402
ISSN:1931-9401
Container-title:Applied Physics Reviews
language:en
Short-container-title:Applied Physics Reviews

Author:

Fisicaro Giuseppe¹^ORCID,Bongiorno Corrado¹,Deretzis Ioannis¹^ORCID,Giannazzo Filippo¹^ORCID,La Via Francesco¹^ORCID,Roccaforte Fabrizio¹^ORCID,Zielinski Marcin²^ORCID,Zimbone Massimo³^ORCID,La Magna Antonino¹^ORCID

Affiliation:

1. Consiglio Nazionale delle Ricerche, Istituto per la Microelettronica e Microsistemi (CNR-IMM), Z.I. VIII Strada 5, I-95121 Catania, Italy

2. NOVASiC, Savoie Technolac, Arche Bat 4, BP267, 73375 Le Bourget du Lac, France

3. Consiglio Nazionale delle Ricerche, Istituto per la Microelettronica e Microsistemi (CNR-IMM), V. S. Sofia 64, 95129 Catania, Italy

Funder

Horizon 2020 Framework Programme

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5132300

Reference72 articles.

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