X‐Ray Extinction Contrast Topography of Silicon Strained by Thin Surface Films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1702943
Reference6 articles.
1. Studies of Individual Dislocations in Crystals by X‐Ray Diffraction Microradiography
2. Die Absorption von R�ntgenstrahlen im Fall der Interferenz
3. Direct Observation of Imperfections in Semiconductor Crystals by Anomalous Transmission of X Rays
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