X-Ray Topography Techniques for Defect Characterization of Crystals
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Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-540-74761-1_42
Reference60 articles.
1. H.J. Scheel: The development of crystal growth technology. In: Crystal Growth Technology, ed. by H.J. Scheel, T. Fukuda (Wiley, New York 2003) pp. 1–14
2. C. Claeys, L. Deferm: Trends and challenges for advanced silicon technologies, Solid State Phenom. 47-48, 1–16 (1993)
3. D.T.J. Hurle: Handbook of Crystal Growth: Thin Films and Epitaxy (Elsevier, New York 1994)
4. G. Dhanaraj, T. Shripathy, H.L. Bhat: Growth and defect characterization of L-arginine phosphate monohydrate, J. Cryst. Growth 113, 456–464 (1991)
5. S. Kawado, S. Lida, Y. Yamaguchi, S. Kimura, Y. Hirose, K. Kajiwara, Y. Chikaura, M. Umeno: Synchrotron-radiation x-ray topography of surface strain in large-diameter silicon wafers, J. Synchrotron. Radiat. 9, 166–168 (2002)
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